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More How to Win at Aptitude Tests电子书

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作       者:Liam Healy

出  版  社:Thorsons

出版时间:2014-04-24

字       数:14.0万

所属分类: 进口书 > 外文原版书 > 励志自助/心灵

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A key guide to the latest developments in assessment and aptitude testing. Aptitude tests – also known as psychometric or IQ tests – are being relied on more and more by employers, schools and colleges. This book clearly explains how to be prepared for every aspect of the aptitude tests as well as tips on handling follow-up interviews. It incorporates new graduate and managerial level tests, as well as up-to-date information on internet-based methods of selection. More How To Win At Aptitude Tests is an essential aid for anyone faced with an aptitude or psychometric test. Includes: How to Boost your Numerical ability ? Improve your Verbal, Abstract and Spatial reasoning ? Increase your Speed and Accuracy. ? Answers are supplied for every test. Healy explains how to best prepare for the test and what to expect from the session itself, as well as the follow-up/validation interview.
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Cover

Title Page

Contents

Introduction

1: About Aptitude Tests

2: Numerical Tests

3: Tests of Verbal Ability

4: Tests of Abstract Ability

5: Tests of Technical Ability

6: Tests of Speed and Perception

7: Personality Tests

8: How to Deal with Tests and the Testing Process

Appendix I – Answers to the Tests

Appendix II — Further Information

Copyright

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